ExCELSiOR Nanoscience Characterization Center
See better. Understand better. Capitalize better.
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Reseach Areas
SPM
Microwave and THz/IR imaging
HF On-wafer
Key Capabilities
SPM / Key capabilities
Microwave and THz/IR imaging / Key capabilities
High Frequency Nano-tools
User Service Program
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Publications
Publications
2016
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2015
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