Publications

2016

  1. Spatial resolution enhancement of near field microwave microscope
    GU S.J., LIN T.J., LASRI T.
    Proceedings of 46th European Microwave Conference, EuMC 2016, London, UK, october 4-6, Session EuMC29 - Measurement Systems, paper EuMC29-01, 544-547, ISBN 978-1-5090-1514-6 ; e-ISBN 978-2-87487-043-9

    doi: 10.1109/EuMC.2016.7824400
  2. Development of a reference wafer for on-wafer testing of extreme impedance devices
    VOTSI H., ROCH-JEUNE I., HADDADI K., LI C., DAMBRINE G., AAEN P., RIDLER N.
    Proceedings of 88th ARFTG Microwave Measurement Symposium, ARFTG 2016, Austin, TX, USA, december 6-9, paper ThB-1, 4 pages, ISBN 978-1-5090-4515-0 ; e-ISBN 978-1-5090-4514-3

    doi: 10.1109/ARFTG.2016.7839719
  3. RF wafer probing with improved contact repeatability using nanometer positioning
    DAFFÉ K., DAMBRINE G., VON KLEIST-RETZOW F., HADDADI K.
    Proceedings of 87th ARFTG Conference, Measurements for Emerging Communications Technologies, San Francisco, CA, USA, may 27, paper Fr1-P-6, 4 pages, e-ISBN 978-1-5090-1308-1

    doi: 10.1109/ARFTG.2016.7501967
  4. Microwave interferometry based open-ended coaxial technique for high sensitivity liquid sensing
    BAKLI H., HADDADI K., LASRI T.
    Proceedings of 4th Advanced Electromagnetics Symposium, AES 2016, Malaga, Spain, july 26-28, Session 1A3 - Measurement Techniques, 326-330, ISSN 2491-2417

    http://metapublishing.org/index.php/MP/catalog/book/16
  5. Continuous wave terahertz molecular laser optically pumped by a quantum cascade laser
    PAGIES A., DUCOURNAU G., LAMPIN J.F.
    Proceedings of 41st International Conference on Infrared, Millimeter and Terahertz Waves, IRMMW-THz 2016, Copenhagen, Denmark, september 25-30, Session H2C - Sources, Detectors, and Receivers V, paper H2C.2, 2 pages, ISBN 978-1-4673-8486-5 ; e-ISBN 978-1-4673-8485-8

    doi: 10.1109/IRMMW-THz.2016.7758379
  6. Mesures de capacités MOS par microscopie hyperfréquence interférométrique
    HADDADI K., BRILLARD C., DAMBRINE G., THERON D.
    Actes des 14èmes Journées de Caractérisation Microondes et Matériaux, JCMM 2016, Calais, France, 23-25 mars, Session 4b - Méthodologies de caractérisation, papier S4b.6, 4 pages
  7. Développement d’une plate-forme hyperfréquence pour la métrologie de nano-dispositifs
    DAFFE K., DAMBRINE G., HADDADI K.
    19èmes Journées Nationales du Réseau Doctoral en Micro-Nanoélectronique, JNRDM 2016, Toulouse, France, 11-13 mai, 2016, papier 5.2.5, 1 page
    http://www.cnfm.fr/VersionFrancaise/animations/JNRDM/JNRDM2016_Papiers/Le11Mai2016/11.Aprem_posters/5.2.5-JNRDM16_Khadim-DAFFE.pdf
  8. [Invited] Towards 300 GHz 100 Gbit/s THz communications
    LATZEL P., PAVANELLO F., BRETIN S., BILLET M., PEYTAVIT E., ZAKNOUNE M., SZRIFTGISER P., LAMPIN J.F., DUCOURNAU G.
    2nd Meeting du GDR NanoTeraMIR, Paris, France, 24-25 novembre, 2016,
    http://nanoteramir.lpa.ens.fr/IMG/pdf/abstract_booklet_-_gdr_nanoteramir-_complete_-_nov_2016.pdf
  9. [Tutorial] Understanding scanning near-field microwave microscopy
    HADDADI K.
    30th International Instrumentation and Meausurement Technology Conference, IEEE I2MTC 2016, Taipei, Taiwan, may 23-26, 2016,
    http://2016.imtc.ieee-ims.org/tutorial-understanding-scanning-near-field-microwave-microscopy
  10. Sensitivity and accuracy analysis in scanning microwave microscopy
    HADDADI K., BRILLARD C., DAMBRINE G., THERON D.
    Proceedings of 2016 IEEE MTT International Microwave Symposium, IMS 2016, San Francisco, CA, USA, may 22-27, paper TH2A-4, 4 pages, e-ISBN 978-1-5090-0698-4

    doi: 10.1109/MWSYM.2016.7540188
  11. Millimeter-wave six-port IQ demodulator in 65 nm SOI CMOS technology
    HADDADI K., LOYEZ C.
    Proceedings of 30th International Instrumentation and Meausurement Technology Conference, IEEE I2MTC 2016, Taipei, Taiwan, may 23-26, 375-379

    doi: 10.1109/I2MTC.2016.7520391
  12. [Review] Advances in terahertz communications accelerated by photonics
    NAGATSUMA T., DUCOURNAU G., RENAUD C.C.
    Nat. Photonics 10, 6 (2016) 371-379 (available online may 31, 2016 ; published june 2016)
    doi: 10.1038/nphoton.2016.65
  13. Low-threshold terahertz molecular laser optically pumped by a quantum cascade laser
    PAGIES A., DUCOURNAU G., LAMPIN J.F.
    APL Photonics 1, 3 (2016) 031302, 6 pages (available online june 6, 2016 ; published june 2016)
    doi: 10.1063/1.4945355
  14. A 17 GHz molecular rectifier
    TRASOBARES J., VUILLAUME D., THERON D., CLEMENT N.
    Nat. Commun. 7 (2016) 12850, 9 pages (published october 3, 2016)
    doi: 10.1038/ncomms12850
  15. Setting parameters influence on accuracy and stability of near-field scanning microwave microscopy platform
    GU S., HADDADI K., EL FELLAHI A., LASRI T.
    IEEE Trans. Instrum. Meas. 65, 4 (2016) 890-897 (available online february 12, 2016 ; published april 2016)
    doi: 10.1109/TIM.2015.2507699
  16. Tunneling spectroscopy of p-type doping in silicon from boron-containing molecular monolayer
    SOSSOE K.K., DURAND C., MATHEY L., ALPHAZAN T., SYLLA A., DZAGLI M.M., MOHOU M.A., NYS J.P., BERTHE M., THIEULEUX C., COPERET C., BARNES J.P., GRANDIDIER B.
    Microelectron. Eng. 149 (2016) 125-128 (available online october 9, 2015 ; published january 5, 2016)
    doi: 10.1016/j.mee.2015.10.002
  17. Length dependence of thermal conductivity by approach-to-equilibrium molecular dynamics
    ZAOUI H., PALLA P.L., CLERI F., LAMPIN E.
    Phys. Rev. B 94, 5 (2016) 054304, 9 pages (available online august 3, 2016 ; published august 1, 2016)
    doi: 10.1103/PhysRevB.94.054304
  18. Optimization of a microelectromechanical systems (MEMS) approach for miniaturized microcantilever-based RF microwave probes
    MARZOUK J., ARSCOTT S., EL FELLAHI A., HADDADI K., BOYAVAL C., LEPILLIET S., LASRI T., DAMBRINE G.
    Sens. Actuator A-Phys. 238 (2016) 51-59 (available online december 2, 2015 ; published february 1, 2016)
    doi: 10.1016/j.sna.2015.10.043
  19. Scanning tunnelling spectroscopy and Raman spectroscopy of monolayer silicene on Ag(111)
    DIAZ ÁLVAREZ A., ZHU T., NYS J.P., BERTHE M., EMPIS M., SCHREIBER J., GRANDIDIER B., XU T.
    Surf. Sci. 653 (2016) 92-96 (available online june 15, 2016 ; published november 2016)
    doi: 10.1016/j.susc.2016.06.005
  20. Lazarevicite-type short-range ordering in ternary III-V nanowires
    SCHNEDLER M., LEFEBVRE I., XU T., PORTZ V., PATRIARCHE G., NYS J.P., PLISSARD S.R., CAROFF P., BERTHE M., EISELE H., DUNIN-BORKOWSKI R.E., EBERT P., GRANDIDIER B.
    Phys. Rev. B 94, 19 (2016) 195306, 6 pages (published november 14, 2016)
    doi: 10.1103/PhysRevB.94.195306

2015

  1. Near-field scanning microwave microscope for subsurface non-destructive characterization
    GU S., HADDADI K., EL FELLAHI A., LASRI T.
    Proceedings of 45th European Microwave Conference, EuMC 2015, Paris, France, september 7-10, Session EuMC09 - Nanoscale Characterization and On-Wafer Calibration, paper EuMC09-01, 155-158, e-ISBN 978-2-87487-039-2

    doi: 10.1109/EuMC.2015.7345723
  2. Manipulating and characterizing with nanorobotics : in-situ SEM technique for centimeter and millimeter waves
    HAENSSLER O.C., FATIKOW S.
    Proceedings of 40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015, Hong Kong, China, august 23-28, paper TS-3, 2 pages, e-ISBN 978-1-4799-8272-1

    doi: 10.1109/IRMMW-THz.2015.7327755
  3. Nanorobotic RF probe station for calibrated on-wafer measurements
    EL FELLAHI A., HADDADI K., MARZOUK J., ARSCOTT S., BOYAVAL C., LASRI T., DAMBRINE G.
    Proceedings of 45th European Microwave Conference, EuMC 2015, Paris, France, september 7-10, Session EuMC09 - Nanoscale Characterization and On-Wafer Calibration, paper EuMC09-03, 163-166, e-ISBN 978-2-87487-039-2

    doi: 10.1109/EuMC.2015.7345725
  4. Measurement accuracy and repeatibility in near-field scanning microwave microscopy
    GU S.J., HADDADI K., EL FELLAHI A., DAMBRINE G., LASRI T.
    Proceedings of 2015 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015, Pisa, Italy, may 11-14, session T8-1 - Measurement Systems and Theory, 1735-1740, e-ISBN 978-1-4799-6144-6

    doi: 10.1109/I2MTC.2015.7151542
  5. Sub-10 nm-scale capacitors and tunnel junctions measurements by SMM coupled to RF interferometry
    WANG F., DARGENT T., DUCATTEAU D., DAMBRINE G., HADDADI K., CLEMENT N., THERON D., LEGRAND B.
    Proceedings of 45th European Microwave Conference, EuMC 2015, Paris, France, september 7-10, Session EuMC35 - Focus Session on Advance in Scanning Probe Microwave and mm-wave Microscopy, paper EuMC35-03, 658-661, e-ISBN 978-2-87487-039-2

    doi: 10.1109/EuMC.2015.7345849
  6. Robotic on-wafer probe station for microwave characterization in a scanning electron microscope
    HADDADI K., EL FELLAHI A., MARZOUK J., ARSCOTT S., BOYAVAL C., LASRI T., DAMBRINE G.
    Proceedings of 63rd IEEE MTT-S International Microwave Symposium, IMS 2015, Phoenix, AZ, USA, may 17-22, session TH2A - Probe-Based Microwave Measurement, paper TH2A-3, 3 pages, e-ISBN 978-1-4799-8275-2

    doi: 10.1109/MWSYM.2015.7166970
  7. THz near-field nanoscopy of graphene layers
    PAGIES A., DEOKAR G., DUCATTEAU D., VIGNAUD D., LAMPIN J.F.
    Proceedings of 40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015, Hong Kong, China, august 23-28, session H3B - Spectroscopy and Material Properties VI, paper H3B-3, 2 pages, e-ISBN 978-1-4799-8272-1

    doi: 10.1109/IRMMW-THz.2015.7327531
  8. Low loss silicon waveguides for the terahertz spectral region
    KUYKEN B., PAGIES A., VANWOLLEGHEM M., YAREKHA D., LAMPIN J.F., ROELKENS G.
    40th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2015, Hong Kong, China, august 23-28, 2015, paper MS-57, 1 page
    http://dx.doi.org/10.1109/IRMMW-THz.2015.7327676
  9. [Invited] High frequency electrical characterization in nano-electronics
    EL FELLAHI A., MARZOUK J., HADDADI K., ARSCOTT S., BOYAVAL C., DAMBRINE G., LASRI T.
    KAUST-IEMN Workshop on Nanotechnology & Photonics, Thuwal, Saudi Arabia, may 6, 2015,
  10. [Invited] Design, fabrication and characterization of micro machined microwave probes for on-wafer testing of microelectronics
    DAMBRINE G., ARSCOTT S., BOYAVAL C., EL FELLAHI A., HADDADI K., LASRI T., MARZOUK J.
    18th European Microwave Week, EuMW 2015, Workshops and Short Courses, Workshop WS08 - Microwave Characterization of Nanoscale Devices, Paris, France, september 6-11, 2015,
  11. On-wafer probe station for microwave metrology at the nanoscale
    EL FELLAHI A., HADDADI K., MARZOUK J., ARSCOTT S., BOYAVAL C., LASRI T., DAMBRINE G.
    Proceedings of 2015 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015, Pisa, Italy, may 11-14, session T1-2 - Advances in Instrumentation and Measurement Developments and Techniques, 1960-1964, e-ISBN 978-1-4799-6144-6

    doi: 10.1109/I2MTC.2015.7151582
  12. High frequency characterization of nanoelectronics : challenges and instrumental solutions
    DAMBRINE G., MARZOUK J., EL FELLAHI A., HADDADI K., ARSCOTT S., BOYAVAL C., LASRI T.
    5th International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2015, Changchun, China, october 5-9, 2015
  13. Self-equilibration of the diameter of Ga-catalyzed GaAs nanowires
    DUBROVSKII V.G., XU T., DIAZ ALVAREZ A., LARRIEU G., PLISSARD S.R., CAROFF P., GLAS F., GRANDIDIER B.
    Nano Lett. 15, 8 (2015) 5580-5584 (available online july 19, 2015 ; published august 12, 2015)
    doi: 10.1021/acs.nanolett.5b02226
  14. Integrated MEMS RF probe for SEM station - Pad size and parasitic capacitance reduction
    EL FELLAHI A., HADDADI K., MARZOUK J., ARSCOTT S., BOYAVAL C., LASRI T., DAMBRINE G.
    IEEE Microw. Wirel. Compon. Lett. 25, 10 (2015) 693-695 (available online august 27, 2015 ; published october 2015)
    doi: 10.1109/LMWC.2015.2463213
  15. Modeling and de-embedding the interferometric scanning microwave microscopy by means of dopant profile calibration
    MICHALAS L., WANG F., BRILLARD C., CHEVALIER N., HARTMANN J.M., MARCELLI R., THERON D.
    Appl. Phys. Lett. 107, 22 (2015) 223102, 5 pages (published november 30, 2015)
    doi: 10.1063/1.4936761
  16. Sub-fF 130 nm MOS varactor characterization using 6.8 GHz interferometry-based reflectometer
    MARIS FERREIRA P., DONCHE C., DELALIN A., QUEMERAIS T., GLORIA D., LASRI T., DAMBRINE G., GAQUIERE C.
    IEEE Microw. Wirel. Compon. Lett. 25, 6 (2015) 418-420 (available online may 6, 2015 ; published june 2015)
    doi: 10.1109/LMWC.2015.2421326
  17. MEMS probes for on-wafer RF microwave characterization of future microelectronics : design, fabrication and characterization
    MARZOUK J., ARSCOTT S., EL FELLAHI A., HADDADI K., LASRI T., BOYAVAL C., DAMBRINE G.
    J. Micromech. Microeng. 25 , 7 (2015) 075024, 11 pages (available online june 23, 2015 ; published july 2015)
    doi: 10.1088/0960-1317/25/7/075024
  18. Sensing of liquid droplets with a scanning near-field microwave microscope
    HADDADI K., GU S., LASRI T.
    Sens. Actuator A-Phys. 230 (2015) 170-174 (available online may 15, 2015 ; published july 1, 2015)
    doi: 10.1016/j.sna.2015.04.028
  19. A thermal diode and novel implementation in a phase-change material
    PALLECCHI E., CHEN Z., FERNANDES G.E., WAN Y.H., KIM J.H., XU J.
    Mater. Horiz. 2, 1 (2015) 125-129 (available online november 18, 2014 ; published january 1, 2015)
    doi: 10.1039/C4MH00193A
  20. Charge blinking statistics of semiconductor nanocrystals revealed by carbon nanotube single charge sensors
    ZBYDNIEWSKA E., DUZYNSKA A., POPOFF M., HOURLIER D., LENFANT S., JUDEK J., ZDROJEK M., MELIN T.
    Nano Lett. 15, 10 (2015) 6349-6356 (available online september 29, 2015 ; published october 14, 2015)
    doi: 10.1021/acs.nanolett.5b01338
  21. Type I band alignment in GaAs81Sb19/GaAs core-shell nanowires
    XU T., WEI M.J., CAPIOD P., DIAZ ALVAREZ A., HAN X.L., TROADEC D., NYS J.P., BERTHE M., LEFEBVRE I., PATRIARCHE G., PLISSARD S.R., CAROFF P., EBERT P., GRANDIDIER B.
    Appl. Phys. Lett. 107, 11 (2015) 112102, 5 pages (published september 14, 2015)
    doi: 10.1063/1.4930991
  22. Investigation of ultra-thin titania films as hole-blocking contacts for organic photovoltaics
    KIM H.C., OU K.L., WU X., NDIONE P.F., BERRY J., LAMBERT Y., MELIN T., ARMSTRONG N.R., GRAHAM S.
    J. Mater. Chem. A 3, 33 (2015) 17332-17343 (available online july 30, 2015 ; published september 7, 2015)
    doi: 10.1039/C5TA04687D
  23. Nonstoichiometric low-temperature grown GaAs nanowires
    DIAZ ALVAREZ A., XU T., TÜTÜNCÜOGLU G., DEMONCHAUX T., NYS J.P., BERTHE M., MATTEINI F., POTTS H.A., TROADEC D., PATRIARCHE G., LAMPIN J.F., COINON C., FONTCUBERTA I MORRAL A., DUNIN-BORKOWSKI R.E., EBERT P. GRANDIDIER B.
    Nano Lett. 15, 10 (2015) 6440-6445 (available online september 4, 2015 ; published october 14, 2015)
    doi: 10.1021/acs.nanolett.5b01802
  24. High charge mobility in two-dimensional percolative networks of PbSe quantum dots connected by atomic bonds
    EVERS W.H., SCHINS J.M., AERTS M., KULKARNI A., CAPIOD P., BERTHE M., GRANDIDIER B., DELERUE C., VAN DER ZANT H.S.J., VAN OVERBEEK C., PETERS J.L., VANMAEKELBERGH D., SIEBBELES L.D.A.
    Nat. Commun. 6 (2015) 8195, 8 pages (published september 24, 2015)
    doi: 10.1038/ncomms9195