The Equipex Excelsior at IEMN provides external users with access to state of the art capabilities for characterization in the field of scanning probe microscopy and high frequency transport measurements. Users can not only perform research experiments with the help of IEMN researchers and engineers to improve their fundamental understanding of materials and devices, but they are also able to develop facility instrumentation in some way with the support of IEMN staff members.
Examples of projects:
- Resistivity of silicene (University of Marseille, TU Berlin)
- Electrical characterization of ultrashallow dopant profiles (CEA-LETI)
- Mobility in two-dimensional PbSe nanocrystal superlattices (Universities of Delft and Utrecht)
- Development and tests of a metrology software (Digital Surf)