High Frequency Nano-tools

  • Vectorial measurement capabilities up to 700 GHz in free space and on wafer
  • Cryogenic probe station for DC and mwave up to 67 GHz
  • mwave and noise characterization up to 220 GHz
  • Non linear measurement with loadpull system up to 110 GHz
  • Non linear Network Analyzer up to 50 GHz