Near Field & SPM Platform
Common facilities for nanoscale devices microscopy and electrical characterization.
Main equipments:
- Ultra high vacuum STM, ambiant T°
- Ultra high vacuum AFM/STM at variable T°
- LT-STM, (4K)
- Open air AFM
- Open air STM
- Four probes STM
Microwave Characterization Platform
Common facilities for electrical characterization measurements.
Research Staff: 5 Engineers, 20 researchers and 40 PhD students
High level equipment: 4 M€, 400 sq. m
Carry out the full electrical characterization of electronic devices :
- 45 MHz -325 GHz ( 500 GHz soon) networks analyzers
- THz measurements using electro-optic sampling
- Noise measurements (up to 220GHz)
- Low temperature (4K) Microwave measurements
- High temperatures (450K) microwave measurements
- Nonlinear measurements
- MEMS and NEMS characterization
Perform the technology feedback