Seminar – « High-field NMR spectroscopy: A key to advance the frontiers of structural biology and material sciences »

SEMINAIRE ExCELSiOR : 12/06/2014 à 10h00 – Amphi. IEMN
sur le thème du projet Lillois ‘RMN1200’

Guy Lippens, Prof. Lille1, Labo de GLYCOBIOLOGIE
Olivier Lafon, Prof. Lille1, UCCS

 

« High-field NMR spectroscopy: A key to advance the frontiers of structural biology and material sciences »
« Nuclear Magnetic Resonance spectroscopy has become an indispensable tool to characterize the atom-level structure and dynamics in a wide range of systems, ranging from biomolecules involved in Alzheimer diseases to energy materials. The increase of magnetic field has allowed us to apply NMR to more and more complex systems. In this context, the University of Lille 1 has recently been selected for the installation of the world’s most powerful NMR instrument with a magnetic field of 28 T, i.e. a 1H Larmor frequency of 1200 MHz. This didactic seminar will present the basic principles of NMR spectroscopy and instrumentation. We will also highlight recent achievements of high-field NMR. The content of the seminar is intended for a non-specialist audience. »

 

Séminaire Excelsior / Anritsu : les nouveaux analyseurs de réseau vectoriel et leurs nouvelles applications

SEMINAIRE EXCELSIOR : 14/02/2014 – IEMN – Laboratoire Central – Villeneuve d’Ascq

Venez découvrir la puissance des nouveaux analyseurs de réseau vectoriel et leurs nouvelles applications

Des présentations techniques se dérouleront dans l’amphithéâtre et des travaux pratiques seront prévus sur les équipements Anritsu dans la salle Pierre Armand.

Séminaire gratuit, UNIQUEMENT sur inscription :
http://www.anritsu.com/en-GB/Promotions/Vstar-rshow/registration-fr.aspx

Seminar – « Novel Family of Broadband Nanocomposite Microwave Absorbers with Carbon Nanotubes in Solid Polymer Films »

Aline EMPLIT
UCL louvain la Neuve
21/11/2013 à 14h00 – IEMN – Salle du Conseil

Abstract : Nanocomposites absorbers with carbon nanotubes (CNTs) in solid polymer films are proposed for high EMI absorption performances. These conductive films exhibit a low permittivity at microwaves, which means a low reflection, with a high absorption capacity. Compared with usual solution based on foamed conductive composites, we indeed show that solid polymer films with two phases matrix and carbon nanotubes charges can be a great alternative to these foams. The two phases considered are polypropylene (PP) and poly[styrene-b-(ethylene-alt-propylene)-b-styrene] (SEPS) copolymer. The electrical conductivity, the permittivity and EMI absorption are correlated with the quality of the dispersion. As a result of the low and constant permittivity of the obtained composite, the absorption performances are not limited by reflection mechanisms but fully controlled by the level of conductivity, fixed by the dispersion and weight content in CNTs.

Seminar – « Scanning microwave microscopy: dopant profiling, spectroscopy, and modeling »

Ferry KIENBERGER
Agilent Research Lab (Linz, Autriche)
24/10/2013 à 14h00 – Amphithéâtre de l’IEMN

Scanning microwave microscopy (SMM) is a recent development in nanoscale imaging technique that combines the lateral resolution of atomic force microscopy (AFM) with the high measurement precision of microwave analysis at GHz frequencies. It consists of an AFM interfaced with a vector network analyzer (VNA). SMM allows to measure complex materials properties for nanoelectronics, materials science, and life science applications with operating frequencies ranging between 1 MHz and 20 GHz. Here we present the basic working principles of SMM and advanced applications. In particular, calibrated capacitance and resistance measurements are shown with a noise level of 1 aF [1]. Calibrated dopant profiles are measured from 10E14 to 10E20 atoms/cm3 for nano-electronics characterization [2].
Pointwise C-V (capacitance-voltage) spectroscopy curves were acquired allowing for the characterization of oxide quality, interface traps, and memory effects of novel materials.
Additionally, a 2D mapping workflow was established to acquire roughly 20.000 C-V curves during one image [3]. Experimental investigations are complemented by finite element radiofrequency modelling using the 3D architecture of the probe and the sample, done with the Agilent software EMPro [4].

Left panel: SMM setup. The AFM is interfaced with a Vector Network Analyzer measuring the electromagnetic properties of the sample. Right panel: Topography and dopant density (dC/dV) image of a semiconductor dopant sample with different dopant concentrations for quantitative and calibrated measurements.

References: [1] H. P. Huber et al, Calibrated nanoscale capacitance measurements using a scanning microwave microscope, Rev. Sci. Instrum. 81, 113701 (2010); [2] H. P. Huber et al., Calibrated nanoscale dopant profiling using a scanning microwave microscope, J. Appl. Phys. 111, 014301 (2012); [3] M. Moertelmaier et al., Continuous capacitance-voltage spectroscopy mapping for scanning microwave microscopy, Ultramicroscopy, Sept. 2013 online. [4] M. Kasper et al., Electromagnetic Simulations at the Nanoscale: EMPro Modeling and Comparison to SMM Experiments. Agilent AppNote Aug. 2013

Journée thématique « Nanocaractérisation »

Dans le cadre des actions d’animation scientifiques au sein du projet ExCELSiOR, une journée est organisée sur le thème de la caractérisation (matériaux, dispositifs, expériences  de microscopie champ proche et/ou hautes fréquences) le 9 Juillet 2013 dans l’amphi – LCI.

La journée repose sur les interventions de doctorants et post-doctorants travaillant dans ce domaine de recherche.
L’objectif  premier de cette journée thématique est de prendre connaissance des activités en cours dans le périmètre d’ExCELSiOR et  de susciter des discussions scientifiques et techniques.

Programme de la journée d’animation scientifique

The far infra-red and THz Nanoscope is now operating and available for scientific communities.

The far infra-red  and THz Nanoscope,  constituting one the major new investments within the ExCELSiOR platform, is now operating and available for scientific communities.
This equipment is dedicated for high contrasted images of mobile carriers in nano-devices, or other characterizations for analysing the local chemical composition and structure of nanoscale materials in semiconductor devices, polymer and biological tissue.

If you are interested by this equipment for measurement services or to develop a new research project please submit your proposal

ExCELSiOR Seminar Cycle – ‘Transport experiments in graphene devices, from exfoliated to epitaxial graphene’ – February 6th, 2013

February 6th; 14:30 Council room

 ‘Transport experiments in graphene devices, from exfoliated to epitaxial  graphene’
par Dr Emiliano Pallecchi; Laboratoire de Photonique et de Nanostructures, Marcoussy

http://exploit.iemn.univ-lille1.fr/a-la-une/excelsior-seminar-cycle-transport-experiments-in-graphene-devices-from-exfoliated-to-epitaxial-graphene

ExCELSiOR Seminar Cycle – Nano-FTIR : Infrared spectroscopic chemical identification of materials at nanoscale – February 7th, 2013

February 7th, 2013 at 11am in the LCI council room – « The NeaSNOM Microscope » – « Nano-FTIR: Infrared spectroscopic chemical identification of materials at nanoscale » by Dr. Andreas HUBER from Neaspec GmbH

http://exploit.iemn.univ-lille1.fr/a-la-une/seminar-nano-ftir-infrared-spectroscopic-chemical-identification-of-materials-at-nanoscale.html