In the frame of a H2020 (end-2017 to end-2020) large project gathering 8 European partners, we have a research engineer position having an expertise on near field microscopy (AFM, STM, …) based techniques and instrumentations.
The job consists to contribute to the development of a new Scanning Microwave Microscope (SMM= AFM + Microwave instrumentations) and associated control systems (Nanonis controller, vector network analyzer…). The recruited person will also participate to campaign of SMM imaging of thin film advanced materials and nanodevices for photovoltaic applications
This activity is located in the nanocharacterization center (1100m2 of new clean room spaces) of the IEMN (jointed CNRS-University of Lille Academic Institute; http://www.iemn.fr/en/).
• The duration of this position is of 18 Months extensible to 24 Months.
• This job will be available on beginning of December 2017.
→ Please send your CV and motivations by email to firstname.lastname@example.org.
Master or Engineer degree with expertise on Scanning Probe Microscopy (SPM) and associated instrumentations as well as SPM imaging treatment.
The selection will be based on the CV and telephone or on-site interview.
The candidate must have a experience on Near field Microscopy and associated instrumentations (controler).
The candidate must have serious knowledges on software dedicated for instrumentation control (e.g. Labview) and AFM imaging (e.g. Gwyddion).
An experience on microwave instrumentation will be an added skill.