The video presents the facilities, the large equipment and the researchers involved in the ExCELSiOR project.
Specifically, the video present an overview of the project and the new environmental controlled spaces of IEMN where ExCELSiOR facilities are installed. The three large ExCELSiOR ‘s instruments are then successively presented. An interview of a PhD student who his research is directly connected to the project as well as an interview of the director of the start-up ‘Vmicro’ show the training and innovation impacts of ExCELSiOR. – Vidéo réalisée par Nicolas Caillon –
French CNRS Research Laboratories Pavilion at European Microwave Week
London 3 – 7 October 2016
European Microwave Week (http://www.eumweek.com/) is the first Europe’s Premier Microwave, RF, Wireless and Radar Event with about 1500 participants. A large exhibition is organized with more than 300 exhibitors including major industrial leaders in the field of microwave technology, equipment and systems and well-known research institutes.
French CNRS Research Laboratories Pavilion exhibits technological and measurement services of the five largest CNRS French laboratories operating in the frame of microwave to THz activities. The main targeted activities concern high frequency advanced technologies, devices, circuits and systems for space, military and public telecommunications and sciences applications. Technological services within RENATECH network involve III-V, Silicon devices and circuits, nanotechnologies, RF MEMS, microwave and millimeter components, calibration kits, while the measurements services offer up to THz on-wafer facilities, EMC large equipment. The stand promotes also the EQPX ExCELSiOR and LEAF.
8:30 – 9:30 Welcome 9:30 Project Phase 1 Assessments (Steering & Scientific committees members, ANR, ExCELSiOR’s board Members, Council Room) 11:00 Project Perspectives (Steering & Scientific committees members, ANR, ExCELSiOR’s board Members, Council Room) 12:00 Lunch 13:00 Visit of New Characterization Space and demonstration of ExCELSiOR facilities. 16:30 Debriefing (Steering & Scientific committees members, ANR, ExCELSiOR’s board Members, Council Room) 17:00 End of Day
AGENDA June 8th 2016
9:00 – 10:00 Welcome 10:00Workshop on ‘Nanocharacterization in industrial environment: recent advances, needs and future trends’, IEMN Amphitheater → 10:15 Marc Chaigneau (Horiba): ‘Tip Enhanced Raman Fast Imaging’ → 11:00 Gerhard Meyer (IBM Zürich): ’ Scanning probe microscopy of single
atoms/molecules on insulating films: molecular geometry and lateral charge transfer’ → 11:45 Johannes Hoffmann (METAS Bern): ‘Gigahertz meets Nanometer’ 12:30 Lunch 14:00 B2B Meetings, Meeting Rooms or Visit of New Characterization Space. 16:30 End of Day
« HF Nanocharacterization: Toward new instrumentation and methods » G. Dambrine – IEMN – University of Lille, France
Abstract: The seminar aims to detail some aspects of the research activity within the frame of the ExCELSiOR Nanosciences Characterization Center (www.excelsior-ncc.eu) located at IEMN-University of Lille-CNRS.
Benefiting of expertise in both HF characterization and near field microscopy, new instruments and/or associated techniques are elaborated to target measurement at low scale associated to broadband spectroscopy from microwave to FIR.
The seminar will particularly focus on:
(i) HF nanoprober constituted of SEM, nano-manipulators and a new class of fine pitch HF probes will be presented; performance to obtain calibrated S-parameters of nanodevices will be discussed.
(ii) Quantitative measurements of attoFarad capacitances using Scanning Microwave Microscope associated to microwave interferometry system will conclude the seminar.
Séminaire Excelsior sur le SMiM de PrimeNano le jeudi 28 Janvier à 10h, salle du conseil
La société PrimeNano (http://www.primenanoinc.com/) a développé un système de microscopie d’impédance à haute fréquence et en champ proche qui s’adapte sur différents AFM (Bruker et Asylum Research).
Ce système est composé en particulier d’une nouvelle pointe AFM qui a la particularité d’être blindée pour améliorer la mesure de très faible capacité.
Nous aurons la visite de Stuart Friedman directeur général qui présentera sa société et sa technologie.