French CNRS Research Laboratories Pavilion at European Microwave Week
London 3 – 7 October 2016

European Microwave Week (http://www.eumweek.com/) is the first Europe’s Premier Microwave, RF, Wireless and Radar Event with about 1500 participants. A large exhibition is organized with more than 300 exhibitors including major industrial leaders in the field of microwave technology, equipment and systems and well-known research institutes.

French CNRS Research Laboratories Pavilion exhibits technological and measurement services of the five largest CNRS French laboratories operating in the frame of microwave to THz activities. The main targeted activities concern high frequency advanced technologies, devices, circuits and systems for space, military and public telecommunications and sciences applications. Technological services within RENATECH network involve III-V, Silicon devices and circuits, nanotechnologies, RF MEMS, microwave and millimeter components, calibration kits, while the measurements services offer up to THz on-wafer facilities, EMC large equipment. The stand promotes also the EQPX ExCELSiOR and LEAF.

AGENDA June 7th 2016

8:30 – 9:30   Welcome
9:30   Project Phase 1 Assessments (Steering & Scientific committees members, ANR, ExCELSiOR’s board Members, Council Room)
11:00   Project Perspectives (Steering & Scientific committees members, ANR, ExCELSiOR’s board Members, Council Room)
12:00   Lunch
13:00   Visit of New Characterization Space and demonstration of ExCELSiOR facilities.
16:30   Debriefing (Steering & Scientific committees members, ANR, ExCELSiOR’s board Members, Council Room)
17:00   End of Day

AGENDA June 8th 2016

9:00 – 10:00   Welcome
10:00   Workshop on ‘Nanocharacterization in industrial environment: recent advances, needs and future trends’, IEMN Amphitheater
→ 10:15   Marc Chaigneau (Horiba): ‘Tip Enhanced Raman Fast Imaging’
→ 11:00   Gerhard Meyer (IBM Zürich):  ’ Scanning probe microscopy of single
atoms/molecules on insulating films: molecular geometry and lateral charge transfer’
→ 11:45   Johannes Hoffmann (METAS Bern): ‘Gigahertz meets Nanometer’
12:30   Lunch
14:00   B2B Meetings, Meeting Rooms or Visit of New Characterization Space.
16:30   End of Day

AGENDA (pdf) agenda_7_june_v1

Workshop ‘La microscopie à sonde locale en région Hauts-de-France : de la caractérisation des matériaux nano structurés à l’AFM sur cellules.’
December 13th 2016
This workshop gathered the main actors

Télécharger le programme au format pdf : programme_journées_Eurananotec

« HF Nanocharacterization: Toward new instrumentation and methods »
G. Dambrine – IEMN – University of Lille, France

Abstract: The seminar aims to detail some aspects of the research activity within the frame of the ExCELSiOR Nanosciences Characterization Center (www.excelsior-ncc.eu) located at IEMN-University of Lille-CNRS.

Benefiting of expertise in both HF characterization and near field microscopy, new instruments and/or associated techniques are elaborated to target measurement at low scale associated to broadband spectroscopy from microwave to FIR.

The seminar will particularly focus on:

(i) HF nanoprober constituted of SEM, nano-manipulators and a new class of fine pitch HF probes will be presented; performance to obtain calibrated S-parameters of nanodevices will be discussed.

(ii) Quantitative measurements of attoFarad capacitances using Scanning Microwave Microscope associated to microwave interferometry system will conclude the seminar.

‘A modified Hodgkin-Huxley model for nanoelectronics’
Prof. Peter BURKE – University of California – Irvine

Monday 26: Arrival at IEMN at 2:00 pm

• Meeting with IEMN members
• Debriefing on the PUF program – EU/US NSF program

Tuesday 27:

• Morning: SMM demo
• Afternoon: Seminar
• Short conclusion

Contact: Henri HAPPY – 03 20 19 78 41