9:00-9:30: Coffee & Welcome address

9:30-10:30 Microwave Characterization:
Jaouad Marzouk
El Fellahi Abdelhatif
Hadley Videlier

10:30-10:45 Coffee Break

10:45-11:45 Scanning Probe Microscopy:
Yannick Lambert
Adrian Diaz
Thomas Demonchaux

11:45-12:45 THz / IR Characterization:
Gabriel Moreno
Salman Nadar
Philipp Latzel

12:45-14:00 Break

14:00-15:20 Advanced materials and technologies:
Michele Carette (IMN) (40mn)
Emmanuel Dubois (works of Hossein Ftouni)
Valeria Lacatena
Gilbert Sassine

15:40-16:00 Coffee Break

16:00-17:00 Microwave Near field Microscopy:
Jorge Trasobares
Sijia Gu
Didier Théron (works of Fei WANG)

Agenda

[ PDF ]

Inscription: https://lciweb.iemn.univ-lille1.fr/excelsior-dev/

09:00 – 10:20
• Prof. Marco Farina – University Politecnica delle Marche, Italy
‘High Resolution Imaging at nanoscale by Scanning Probe Microscopy’
• Dr. Ferry Kienberger – Keysight Technologies, Austria
‘Sub-surface imaging with scanning microwave microscopy and application to semiconductors, materials science, and living cells in liquid’

15 Juillet 2014, 11h, amphithéâtre IEMN

Professor Yang Hao, Queen Mary University

Here we experimentally study the microwave absorption and near-field radiation behaviour of monolayer and few-layer, large-area CVD graphene in the C and X bands. Artificial stacking of CVD graphene reduces the sheet resistance, as verified by non-contact microwave cavity measurements and four-probe DC resistivity. The multilayer stacked graphene exhibits increased absorption determined by the total sheet resistance. The underlying mechanism could enable us to apply nanoscale graphene sheets as optically transparent radar absorbers. Near-field radiation measurements show that our present few-layer graphene patches with sheet resistance more than 600 Ω/sq exhibit no distinctive microwave resonance and radiate less electromagnetic power with increasing layers; however, our theoretical prediction suggests that for samples to be practical as microwave antennas, doped multilayer graphene with sheet resistance less than 10 Ω/sq is required.

SEMINAIRE EXCELSIOR : 14/02/2014 – IEMN – Laboratoire Central – Villeneuve d’Ascq

Venez découvrir la puissance des nouveaux analyseurs de réseau vectoriel et leurs nouvelles applications

Des présentations techniques se dérouleront dans l’amphithéâtre et des travaux pratiques seront prévus sur les équipements Anritsu dans la salle Pierre Armand.

Séminaire gratuit, UNIQUEMENT sur inscription :
http://www.anritsu.com/en-GB/Promotions/Vstar-rshow/registration-fr.aspx

Aline EMPLIT
UCL louvain la Neuve
21/11/2013 à 14h00 – IEMN – Salle du Conseil

Abstract : Nanocomposites absorbers with carbon nanotubes (CNTs) in solid polymer films are proposed for high EMI absorption performances. These conductive films exhibit a low permittivity at microwaves, which means a low reflection, with a high absorption capacity. Compared with usual solution based on foamed conductive composites, we indeed show that solid polymer films with two phases matrix and carbon nanotubes charges can be a great alternative to these foams. The two phases considered are polypropylene (PP) and poly[styrene-b-(ethylene-alt-propylene)-b-styrene] (SEPS) copolymer. The electrical conductivity, the permittivity and EMI absorption are correlated with the quality of the dispersion. As a result of the low and constant permittivity of the obtained composite, the absorption performances are not limited by reflection mechanisms but fully controlled by the level of conductivity, fixed by the dispersion and weight content in CNTs.

Ferry KIENBERGER
Agilent Research Lab (Linz, Autriche)
24/10/2013 à 14h00 – Amphithéâtre de l’IEMN

Scanning microwave microscopy (SMM) is a recent development in nanoscale imaging technique that combines the lateral resolution of atomic force microscopy (AFM) with the high measurement precision of microwave analysis at GHz frequencies. It consists of an AFM interfaced with a vector network analyzer (VNA). SMM allows to measure complex materials properties for nanoelectronics, materials science, and life science applications with operating frequencies ranging between 1 MHz and 20 GHz. Here we present the basic working principles of SMM and advanced applications. In particular, calibrated capacitance and resistance measurements are shown with a noise level of 1 aF [1]. Calibrated dopant profiles are measured from 10E14 to 10E20 atoms/cm3 for nano-electronics characterization [2].
Pointwise C-V (capacitance-voltage) spectroscopy curves were acquired allowing for the characterization of oxide quality, interface traps, and memory effects of novel materials.
Additionally, a 2D mapping workflow was established to acquire roughly 20.000 C-V curves during one image [3]. Experimental investigations are complemented by finite element radiofrequency modelling using the 3D architecture of the probe and the sample, done with the Agilent software EMPro [4].

Left panel: SMM setup. The AFM is interfaced with a Vector Network Analyzer measuring the electromagnetic properties of the sample. Right panel: Topography and dopant density (dC/dV) image of a semiconductor dopant sample with different dopant concentrations for quantitative and calibrated measurements.

References: [1] H. P. Huber et al, Calibrated nanoscale capacitance measurements using a scanning microwave microscope, Rev. Sci. Instrum. 81, 113701 (2010); [2] H. P. Huber et al., Calibrated nanoscale dopant profiling using a scanning microwave microscope, J. Appl. Phys. 111, 014301 (2012); [3] M. Moertelmaier et al., Continuous capacitance-voltage spectroscopy mapping for scanning microwave microscopy, Ultramicroscopy, Sept. 2013 online. [4] M. Kasper et al., Electromagnetic Simulations at the Nanoscale: EMPro Modeling and Comparison to SMM Experiments. Agilent AppNote Aug. 2013