« HF Nanocharacterization: Toward new instrumentation and methods »
G. Dambrine – IEMN – University of Lille, France
Abstract: The seminar aims to detail some aspects of the research activity within the frame of the ExCELSiOR Nanosciences Characterization Center (www.excelsior-ncc.eu) located at IEMN-University of Lille-CNRS.
Benefiting of expertise in both HF characterization and near field microscopy, new instruments and/or associated techniques are elaborated to target measurement at low scale associated to broadband spectroscopy from microwave to FIR.
The seminar will particularly focus on:
(i) HF nanoprober constituted of SEM, nano-manipulators and a new class of fine pitch HF probes will be presented; performance to obtain calibrated S-parameters of nanodevices will be discussed.
(ii) Quantitative measurements of attoFarad capacitances using Scanning Microwave Microscope associated to microwave interferometry system will conclude the seminar.
‘A modified Hodgkin-Huxley model for nanoelectronics’
Prof. Peter BURKE – University of California – Irvine
Monday 26: Arrival at IEMN at 2:00 pm
- Meeting with IEMN members
- Debriefing on the PUF program – EU/US NSF program
- Morning: SMM demo
- Afternoon: Seminar
- Short conclusion
Contact: Henri HAPPY – 03 20 19 78 41
Séminaire Excelsior sur le SMiM de PrimeNano le jeudi 28 Janvier à 10h, salle du conseil
La société PrimeNano (http://www.primenanoinc.com/) a développé un système de microscopie d’impédance à haute fréquence et en champ proche qui s’adapte sur différents AFM (Bruker et Asylum Research).
Ce système est composé en particulier d’une nouvelle pointe AFM qui a la particularité d’être blindée pour améliorer la mesure de très faible capacité.
Nous aurons la visite de Stuart Friedman directeur général qui présentera sa société et sa technologie.
9:00-9:30: Coffee & Welcome address
9:30-10:30 Microwave Characterization:
El Fellahi Abdelhatif
10:30-10:45 Coffee Break
10:45-11:45 Scanning Probe Microscopy:
11:45-12:45 THz / IR Characterization:
14:00-15:20 Advanced materials and technologies:
Michele Carette (IMN) (40mn)
Emmanuel Dubois (works of Hossein Ftouni)
15:40-16:00 Coffee Break
16:00-17:00 Microwave Near field Microscopy:
Didier Théron (works of Fei WANG)
[ PDF ]
09:00 – 10:20
• Prof. Marco Farina – University Politecnica delle Marche, Italy
‘High Resolution Imaging at nanoscale by Scanning Probe Microscopy’
• Dr. Ferry Kienberger – Keysight Technologies, Austria
‘Sub-surface imaging with scanning microwave microscopy and application to semiconductors, materials science, and living cells in liquid’
10:20 – 10:30 Pause10:30 – 11:50
• Prof. Philip Moriarty – Nottingham University, UK
‘Pauli’s Principle in Probe Microscopy: Do We Really See Bonds?’
• Prof. Rolf Möller – University of Duisburg-Essen
‘Revealing molecular dynamics by scanning noise microscopy and spectroscopy’11:50 – 13:00 Lab Tour13:00 – 14:00 Lunch14:00 – 16:00
• Dr. Frank Lafont – University of Lille, France
‘ImagInEx BioMed Project – BioImaging Center Lille’
• Dr. Christoph Lange – Regensburg University, Germany
‘Sub-Cycle Electron Dynamics in Atomically Strong THz Fields: From Interband Zener Tunneling to High-Harmonic Generation’
• Dr. Yannick De Wilde – ESPCI Paris Tech, France
‘Infrared near-field imaging and spectroscopy ’16:00 – 16:30 Pause – discussions16:30 End
15 Juillet 2014, 11h, amphithéâtre IEMN
Professor Yang Hao, Queen Mary University
Here we experimentally study the microwave absorption and near-field radiation behaviour of monolayer and few-layer, large-area CVD graphene in the C and X bands. Artificial stacking of CVD graphene reduces the sheet resistance, as verified by non-contact microwave cavity measurements and four-probe DC resistivity. The multilayer stacked graphene exhibits increased absorption determined by the total sheet resistance. The underlying mechanism could enable us to apply nanoscale graphene sheets as optically transparent radar absorbers. Near-field radiation measurements show that our present few-layer graphene patches with sheet resistance more than 600 Ω/sq exhibit no distinctive microwave resonance and radiate less electromagnetic power with increasing layers; however, our theoretical prediction suggests that for samples to be practical as microwave antennas, doped multilayer graphene with sheet resistance less than 10 Ω/sq is required.
SEMINAIRE ExCELSiOR : 12/06/2014 à 10h00 – Amphi. IEMN
sur le thème du projet Lillois ‘RMN1200’
Guy Lippens, Prof. Lille1, Labo de GLYCOBIOLOGIE
Olivier Lafon, Prof. Lille1, UCCS
« High-field NMR spectroscopy: A key to advance the frontiers of structural biology and material sciences »
« Nuclear Magnetic Resonance spectroscopy has become an indispensable tool to characterize the atom-level structure and dynamics in a wide range of systems, ranging from biomolecules involved in Alzheimer diseases to energy materials. The increase of magnetic field has allowed us to apply NMR to more and more complex systems. In this context, the University of Lille 1 has recently been selected for the installation of the world’s most powerful NMR instrument with a magnetic field of 28 T, i.e. a 1H Larmor frequency of 1200 MHz. This didactic seminar will present the basic principles of NMR spectroscopy and instrumentation. We will also highlight recent achievements of high-field NMR. The content of the seminar is intended for a non-specialist audience. »
SEMINAIRE EXCELSIOR : 14/02/2014 – IEMN – Laboratoire Central – Villeneuve d’Ascq
Venez découvrir la puissance des nouveaux analyseurs de réseau vectoriel et leurs nouvelles applications
Des présentations techniques se dérouleront dans l’amphithéâtre et des travaux pratiques seront prévus sur les équipements Anritsu dans la salle Pierre Armand.
Séminaire gratuit, UNIQUEMENT sur inscription :
UCL louvain la Neuve
21/11/2013 à 14h00 – IEMN – Salle du Conseil
Abstract : Nanocomposites absorbers with carbon nanotubes (CNTs) in solid polymer films are proposed for high EMI absorption performances. These conductive films exhibit a low permittivity at microwaves, which means a low reflection, with a high absorption capacity. Compared with usual solution based on foamed conductive composites, we indeed show that solid polymer films with two phases matrix and carbon nanotubes charges can be a great alternative to these foams. The two phases considered are polypropylene (PP) and poly[styrene-b-(ethylene-alt-propylene)-b-styrene] (SEPS) copolymer. The electrical conductivity, the permittivity and EMI absorption are correlated with the quality of the dispersion. As a result of the low and constant permittivity of the obtained composite, the absorption performances are not limited by reflection mechanisms but fully controlled by the level of conductivity, fixed by the dispersion and weight content in CNTs.
Agilent Research Lab (Linz, Autriche)
24/10/2013 à 14h00 – Amphithéâtre de l’IEMN
Scanning microwave microscopy (SMM) is a recent development in nanoscale imaging technique that combines the lateral resolution of atomic force microscopy (AFM) with the high measurement precision of microwave analysis at GHz frequencies. It consists of an AFM interfaced with a vector network analyzer (VNA). SMM allows to measure complex materials properties for nanoelectronics, materials science, and life science applications with operating frequencies ranging between 1 MHz and 20 GHz. Here we present the basic working principles of SMM and advanced applications. In particular, calibrated capacitance and resistance measurements are shown with a noise level of 1 aF . Calibrated dopant profiles are measured from 10E14 to 10E20 atoms/cm3 for nano-electronics characterization .
Pointwise C-V (capacitance-voltage) spectroscopy curves were acquired allowing for the characterization of oxide quality, interface traps, and memory effects of novel materials.
Additionally, a 2D mapping workflow was established to acquire roughly 20.000 C-V curves during one image . Experimental investigations are complemented by finite element radiofrequency modelling using the 3D architecture of the probe and the sample, done with the Agilent software EMPro .
Left panel: SMM setup. The AFM is interfaced with a Vector Network Analyzer measuring the electromagnetic properties of the sample. Right panel: Topography and dopant density (dC/dV) image of a semiconductor dopant sample with different dopant concentrations for quantitative and calibrated measurements.
References:  H. P. Huber et al, Calibrated nanoscale capacitance measurements using a scanning microwave microscope, Rev. Sci. Instrum. 81, 113701 (2010);  H. P. Huber et al., Calibrated nanoscale dopant profiling using a scanning microwave microscope, J. Appl. Phys. 111, 014301 (2012);  M. Moertelmaier et al., Continuous capacitance-voltage spectroscopy mapping for scanning microwave microscopy, Ultramicroscopy, Sept. 2013 online.  M. Kasper et al., Electromagnetic Simulations at the Nanoscale: EMPro Modeling and Comparison to SMM Experiments. Agilent AppNote Aug. 2013