The video presents the facilities, the large equipment and the researchers involved in the ExCELSiOR project.
Specifically, the video present an overview of the project and the new environmental controlled spaces of IEMN where ExCELSiOR facilities are installed. The three large ExCELSiOR ‘s instruments are then successively presented. An interview of a PhD student who his research is directly connected to the project as well as an interview of the director of the start-up ‘Vmicro’ show the training and innovation impacts of ExCELSiOR.
– Vidéo réalisée par Nicolas Caillon –

Engineer Position in Near field Microscopy and Instrumentation

In the frame of a H2020 (end-2017 to end-2020) large project gathering 8 European partners, we have a research engineer position having an expertise on near field microscopy (AFM, STM, …) based techniques and instrumentations.

The job consists to contribute to the development of a new Scanning Microwave Microscope (SMM= AFM + Microwave instrumentations) and associated control systems (Nanonis controller, vector network analyzer…). The recruited person will also participate to campaign of SMM imaging of thin film advanced materials and nanodevices for photovoltaic applications

This activity is located in the nanocharacterization center (1100m2 of new clean room spaces) of the IEMN (jointed CNRS-University of Lille Academic Institute;

• The duration of this position is of 18 Months extensible to 24 Months.
• This job will be available on beginning of December 2017.
Please send your CV and motivations by email to

Eligibility criteria
Master or Engineer degree with expertise on Scanning Probe Microscopy (SPM) and associated instrumentations as well as SPM imaging treatment.

Selection process
The selection will be based on the CV and telephone or on-site interview.

The candidate must have a experience on Near field Microscopy and associated instrumentations (controler).
The candidate must have serious knowledges on software dedicated for instrumentation control (e.g. Labview) and AFM imaging (e.g.  Gwyddion).

Specific Requirements
An experience on microwave instrumentation will be an added skill.


IEMN and Rohde & Schwarz seminar: From Nano to TeraHertz on Thursday, June 23, 2016

At nano level (nano-characterization) and at high frequencies (THz), major challenges are currently installed and measurement as well as characterization techniques have progressed during last years. This day main goal is to provide an overview of several research fields/applications currently under development : free-space characterization of materials, probing at THz frequencies, as well as very small scale measurement (microwave nano – probing and near-field THz). Applications of sub- TeraHertz/THz are also displayed through wireless communications, frequency multiplication and meteorology. This day, organized by IEMN and Rohde & Schwarz, will merge a group of lead researchers in these areas and a tour of the experimental facilities will be proposed at the end of the event.


9:00  → Welcome

9:15  → Free space calibration and S parameters measurement test bench for the dielectric material characterization in Ka, W and D-band by Daniel Bourreau, TELECOM Bretagne
This presentation deals with our experience on free space calibration techniques and measurements at millimeter waves without „Time Domain Gating“, in the Ka, W and D bands. Simulated and measured S-parameters for dielectric slabs show the validity of the permittivity extraction method over the frequency bands. This test bench could be also used for the metamaterial and non-solid material characterizations.

9:55  → Critical success factors for wafer-level measurements at THz frequencies
by Andrej Rumiantsev, MPI
Key requirements for precise wafer-level measurements at sub-mm wave frequency range such as stability of the probe system, positioning accuracy and contact repeatability as well as loss in the measurement path. Special attention will be given to the system S-parameter calibration and to methods for minimising calibration residual errors.

10:35 → Break

10:50 → THz technology for ground-based & space weather forecasting and meteorological applications by Gerrit Maschwitz, Radiometer Physics GmbH
This talk presents the latest advances in the development of ground based and space based millimeter and sub-millimeter wave radiometric instruments for the atmopheric remote sensing. As an example, passive ground based radiometer with unprecedented accuracy used to observe water vapor and temperature profiles will be presented. Active ground based active systems such as FMCW radar and scintillation radiometers have been recently developed in order to sound clouds and monitor evaporation processes happening close to the ground. Finally, a space based instrument (ICI) is currently under development for the next generation of polar orbiting meteorological satellite (MetOp-SG) to observe high altitude ice clouds.

11:30 →  Body-scanner by Christian Evers, Rohde & Schwarz
This topic deals with the presentation of the active millimeter wave range body scanner, the R&S QPS100, today in operation in several airports in order to achieve safe and unimpeded traffic. The quality of a such screening system is influenced by several technical parameters, as for instance the aperture size of the antenna array, the used bandwidth, the number of single transmitting and receiving antennas and their smart arrangement. In addition the efficiency in reconstructing the image as well as an intelligent image processing are mandatory for a capable screening system.

12:10 → Lunch

13:25 → All-electronic 300 GHz analog Transmit/Receive frontends for multi-gigabit indoor wireless communication by Ingmar Kalfass, University of Stuttgart (Germany)
This contribution presents a full MMIC chip set realizing a 300 GHz transmit and receive RF frontend. The radio is dedicated to future high data indoor wireless communication serving application scenarii such as smart offices, data centers and home theaters. Transmission experiments in a single-input single-output, line of sight setup achieve up to 40 Gbit/s data rates. Measures to achieve the target data rate of 100 Gbit/s and electronic beam-steering are discussed.

14:05 → Schottky diode based THz circuits for coherent generation and detection by Alain Maestrini, Observatoire de Paris
This talk will present recent advances in Europe for enabling compact, low-noise THz coherent receivers working at room temperature using MMIC-like Schottky frequency multipliers and mixers for various applications including astronomy, remote sensing and instrumentation.

14:45 → Break

15:00 →  TeraHertz near-field nanoscopy by Jean-François Lampin, IEMN
THz near-field nanoscopy is a new technic that allows THz waves imaging with subwavelength resolution. We use the scattering scanning near-field optical microscopy (s-SNOM) approach to image permittivity contrasts with <100 nm resolutions. Images of graphene layers at 2.5 THz will be shown as a typical example.

15:40 → MicroWave Nanoprober : a new class of instrument for hyper frequency nanoprobing by Sophie Eliet, IEMN
To answer their need, manufacturing and innovation of nanometric size-devices, require new processes as well as experimental methodologies. A new way results by combination of the Scanning Electron Microscopy (SEM) at low voltage, nanomanipulators and miniaturized probes dedicated for microwave. The miniaturized probes fabricated at IEMN seem a solution for accurate measurements of S-parameters and present a reduction of one order of parasitics magnitude.

16:20 → Questions and conclusion

16:45 → Visit of the RF/MEMS characterization area
Registration with Guillaume Ducournau

For more information, please feel free to contact :

Phone : 01 41 36 10 00
E-mail :

Phone : 03 20 19 78 47
E-mail :

French CNRS Research Laboratories Pavilion at European Microwave Week: 3-7th 2016

French CNRS Research Laboratories Pavilion at European Microwave Week
London 3 – 7 October 2016

European Microwave Week ( is the first Europe’s Premier Microwave, RF, Wireless and Radar Event with about 1500 participants. A large exhibition is organized with more than 300 exhibitors including major industrial leaders in the field of microwave technology, equipment and systems and well-known research institutes.

French CNRS Research Laboratories Pavilion exhibits technological and measurement services of the five largest CNRS French laboratories operating in the frame of microwave to THz activities. The main targeted activities concern high frequency advanced technologies, devices, circuits and systems for space, military and public telecommunications and sciences applications. Technological services within RENATECH network involve III-V, Silicon devices and circuits, nanotechnologies, RF MEMS, microwave and millimeter components, calibration kits, while the measurements services offer up to THz on-wafer facilities, EMC large equipment. The stand promotes also the EQPX ExCELSiOR and LEAF.

Annual review Meeting ‘ExCELSiOR’s Phase 1 Assessments’ June 7-8th 2016

AGENDA June 7th 2016

8:30 – 9:30   Welcome
9:30   Project Phase 1 Assessments (Steering & Scientific committees members, ANR, ExCELSiOR’s board Members, Council Room)
11:00   Project Perspectives (Steering & Scientific committees members, ANR, ExCELSiOR’s board Members, Council Room)
12:00   Lunch
13:00   Visit of New Characterization Space and demonstration of ExCELSiOR facilities.
16:30   Debriefing (Steering & Scientific committees members, ANR, ExCELSiOR’s board Members, Council Room)
17:00   End of Day

AGENDA June 8th 2016

9:00 – 10:00   Welcome
10:00   Workshop on ‘Nanocharacterization in industrial environment: recent advances, needs and future trends’, IEMN Amphitheater
→ 10:15   Marc Chaigneau (Horiba): ‘Tip Enhanced Raman Fast Imaging’
→ 11:00   Gerhard Meyer (IBM Zürich):  ’ Scanning probe microscopy of single
atoms/molecules on insulating films: molecular geometry and lateral charge transfer’
→ 11:45   Johannes Hoffmann (METAS Bern): ‘Gigahertz meets Nanometer’
12:30   Lunch
14:00   B2B Meetings, Meeting Rooms or Visit of New Characterization Space.
16:30   End of Day

AGENDA (pdf) agenda_7_june_v1

Workshop ‘La microscopie à sonde locale en région Hauts-de-France : de la caractérisation des matériaux nano structurés à l’AFM sur cellules.’ December 13th 2016

Workshop ‘La microscopie à sonde locale en région Hauts-de-France : de la caractérisation des matériaux nano structurés à l’AFM sur cellules.’
December 13th 2016
This workshop gathered the main actors

Télécharger le programme au format pdf : programme_journées_Eurananotec

Kolloquium der Elektrotechnik und Informationstechnik, University of Stuttgart December 6th, 2016

« HF Nanocharacterization: Toward new instrumentation and methods »
G. Dambrine – IEMN – University of Lille, France

Abstract: The seminar aims to detail some aspects of the research activity within the frame of the ExCELSiOR Nanosciences Characterization Center ( located at IEMN-University of Lille-CNRS.

Benefiting of expertise in both HF characterization and near field microscopy, new instruments and/or associated techniques are elaborated to target measurement at low scale associated to broadband spectroscopy from microwave to FIR.

The seminar will particularly focus on:

(i) HF nanoprober constituted of SEM, nano-manipulators and a new class of fine pitch HF probes will be presented; performance to obtain calibrated S-parameters of nanodevices will be discussed.

(ii) Quantitative measurements of attoFarad capacitances using Scanning Microwave Microscope associated to microwave interferometry system will conclude the seminar.

Séminaire Prof. Peter BURKE 26-27/09/2016

‘A modified Hodgkin-Huxley model for nanoelectronics’
Prof. Peter BURKE – University of California – Irvine

Monday 26: Arrival at IEMN at 2:00 pm

  • Meeting with IEMN members
  • Debriefing on the PUF program – EU/US NSF program

Tuesday 27:

  • Morning: SMM demo
  • Afternoon: Seminar
  • Short conclusion

Contact: Henri HAPPY – 03 20 19 78 41

Séminaire Excelsior : SMiM de PrimeNano – 28/01/2016

Séminaire Excelsior sur le SMiM de PrimeNano le jeudi 28 Janvier à 10h, salle du conseil

La société PrimeNano ( a développé un système de microscopie d’impédance à haute fréquence et en champ proche qui s’adapte sur différents AFM (Bruker et Asylum Research).
Ce système est composé en particulier d’une nouvelle pointe AFM qui a la particularité d’être blindée pour améliorer la mesure de très faible capacité.
Nous aurons la visite de Stuart Friedman directeur général qui présentera sa société et sa technologie.

Young Researchers ExCELSiOR’s Workshop – July 1st, IEMN

9:00-9:30: Coffee & Welcome address

9:30-10:30 Microwave Characterization:
Jaouad Marzouk
El Fellahi Abdelhatif
Hadley Videlier

10:30-10:45 Coffee Break

10:45-11:45 Scanning Probe Microscopy:
Yannick Lambert
Adrian Diaz
Thomas Demonchaux

11:45-12:45 THz / IR Characterization:
Gabriel Moreno
Salman Nadar
Philipp Latzel

12:45-14:00 Break

14:00-15:20 Advanced materials and technologies:
Michele Carette (IMN) (40mn)
Emmanuel Dubois (works of Hossein Ftouni)
Valeria Lacatena
Gilbert Sassine

15:40-16:00 Coffee Break

16:00-17:00 Microwave Near field Microscopy:
Jorge Trasobares
Sijia Gu
Didier Théron (works of Fei WANG)